Fourier Ptychography

Background

Ptychography (Scanning Difraction Microscopy)

Coherent illumination is focused/confined to an area on the specimen and the detector records the interference pattern without the use of any focusing elements between the sample and the detector. A series of interference patterns are collected for each position as the area of illumination is scanned across the image.

Citations

  1. Zheng, G., Horstmeyer, R. & Yang, C. Wide-field, high-resolution Fourier ptychographic microscopy. Nature Photon 7, 739–745 (2013). https://doi.org/10.1038/nphoton.2013.187